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MOS interface physics, process and characterization /

"The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices and integrated circuits is high quality MOS structure. This book contains abundant experimental example...

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Bibliographic Details
Main Authors: Wang, Shengkai, 1984- (Author), Wang, Xiaolei, 1985- (Author)
Corporate Author: Taylor & Francis
Format: eBook
Language:English
Published: Boca Raton : CRC Press, 2022.
Edition:First edition.
Subjects:
Metal oxide semiconductors > Design and construction > Mathematics.
Semiconductors > Junctions.
Integrated circuits > Research.
Solid state physics > Experiments.
Semi-conducteurs > Jonctions.
Circuits intégrés > Recherche.
Physique de l'état solide > Expériences.
TECHNOLOGY / General
TECHNOLOGY / Electronics / General
TECHNOLOGY / Electronics / Microelectronics
Integrated circuits > Research
Semiconductors > Junctions
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Summary:"The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices and integrated circuits is high quality MOS structure. This book contains abundant experimental examples focusing on MOS structure. The volume will be an essential reference for academics and postgraduates within the field of microelectronics"--
Physical Description:1 online resource
Bibliography:Includes bibliographical references.
ISBN:9781000455762
1000455769
9781003216285
1003216285
9781000455748
1000455742