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MOS interface physics, process and characterization /

"The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices and integrated circuits is high quality MOS structure. This book contains abundant experimental example...

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Bibliographic Details
Main Authors: Wang, Shengkai, 1984- (Author), Wang, Xiaolei, 1985- (Author)
Corporate Author: Taylor & Francis
Format: eBook
Language:English
Published: Boca Raton : CRC Press, 2022.
Edition:First edition.
Subjects:
Metal oxide semiconductors > Design and construction > Mathematics.
Semiconductors > Junctions.
Integrated circuits > Research.
Solid state physics > Experiments.
Semi-conducteurs > Jonctions.
Circuits intégrés > Recherche.
Physique de l'état solide > Expériences.
TECHNOLOGY / General
TECHNOLOGY / Electronics / General
TECHNOLOGY / Electronics / Microelectronics
Integrated circuits > Research
Semiconductors > Junctions
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Call Number: TK7871.99.M44
 
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