X-ray diffraction : modern experimental techniques /

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern sy...

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Bibliographic Details
Corporate Author: Taylor & Francis
Other Authors: Seeck, Oliver H., 1966- (Editor), Murphy, Bridget M., 1969- (Editor)
Format: eBook
Language:English
Published: Singapore : Pan Stanford Publishing, [2015]
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electr.
Physical Description:1 online resource : illustrations (black and white, and colour)
ISBN:9789814303606
9814303607