X-ray diffraction : modern experimental techniques /

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern sy...

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Bibliographic Details

Corporate Author:	Taylor & Francis
Other Authors:	Seeck, Oliver H., 1966- (Editor), Murphy, Bridget M., 1969- (Editor)
Format:	eBook
Language:	English
Published:	Singapore : Pan Stanford Publishing, [2015]
Subjects:	Radiography, Industrial. X-rays > Diffraction. Nanostructured materials > Analysis. X-Ray Diffraction Radiographie industrielle. Rayons X > Diffraction. Nanomatériaux > Analyse. x-ray diffraction. Radiography, Industrial X-rays > Diffraction Electronic books.
Online Access:	Connect to the full text of this electronic book