Testing for small-delay defects in nanoscale CMOS integrated circuits /

Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality is...

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Bibliographic Details

Corporate Author:	Taylor & Francis
Other Authors:	Goel, Sandeep K. (Editor), Chakrabarty, Krishnendu (Editor)
Format:	eBook
Language:	English
Language Notes:	English.
Published:	Boca Raton : CRC Press, Taylor & Francis Group, [2014]
Series:	Devices, circuits, and systems.
Subjects:	Metal oxide semiconductors, Complementary > Testing. MOS complémentaires > Essais. TECHNOLOGY & ENGINEERING > Mechanical. Metal oxide semiconductors, Complementary > Testing Electronic books.
Online Access:	Connect to the full text of this electronic book Connect to the full text of this electronic book