Atomic force microscopy for energy research /

"Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of fu...

Full description

Bibliographic Details
Corporate Author: Taylor & Francis
Other Authors: Shen, Cai (Editor)
Format: eBook
Language:English
Published: Boca Raton, FL : CRC Press, 2022.
Edition:First edition.
Series:Emerging materials and technologies.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:"Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials such as lithium batteries, electrochemical catalysis, solar cells, and other energy-related materials are addressed. With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics working with AFM or planning to use it in their own fields of research, especially energy research"--
Physical Description:1 online resource (xiii, 441 pages) : illustrations (chiefly color)
Bibliography:Includes bibliographical references and index.
ISBN:9781000577877
1000577872
9781003174042
1003174043
9781000577921
1000577929