Atomic force microscopy for energy research /

"Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of fu...

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Bibliographic Details

Corporate Author:	Taylor & Francis
Other Authors:	Shen, Cai (Editor)
Format:	eBook
Language:	English
Published:	Boca Raton, FL : CRC Press, 2022.
Edition:	First edition.
Series:	Emerging materials and technologies.
Subjects:	Atomic force microscopy. Power resources > Research. Microscopie à force atomique. Ressources énergétiques > Recherche. SCIENCE / Energy Atomic force microscopy Power resources > Research Electronic books.
Online Access:	Connect to the full text of this electronic book