Semiconductor x-ray detectors /

Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium...

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Bibliographic Details
Main Authors: Lowe, B. G. (Author), Sareen, R. A. (Author)
Corporate Author: Taylor & Francis
Format: eBook
Language:English
Published: Boca Raton, FL : CRC Press, [2014]
Series:Sensors series.
Subjects:
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Call Number: TK7871.85 .L69 2014
 
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TK7871.85 .L69 2014 Available