Semiconductor devices in harsh conditions /

"This book introduces the reader to a number of challenges for the operation of electronic devices in various harsh environmental conditions. While some chapters focus on measuring and understanding the effects of these environments on electronic components, many also propose design solutions,...

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Bibliographic Details

Corporate Author:	Taylor & Francis
Other Authors:	Weide-Zaage, Kirsten (Editor), Chrzanowska-Jeske, Malgorzata (Editor), Iniewski, Krzysztof (Editor)
Format:	eBook
Language:	English
Published:	Boca Raton : Taylor & Francis, a CRC title, part of the Taylor & Francis imprint, a member of the Taylor & Francis Group, the academic division of T & F Informa, plc, [2017]
Series:	Devices, circuits, and systems.
Subjects:	Semiconductors > Reliability. Extreme environments. Environmental testing. Semi-conducteurs > Fiabilité. Milieux extrêmes. Essais d'environnement. accelerated weathering. Environmental testing Extreme environments Semiconductors > Reliability Electronic books. handbooks. Handbooks and manuals. Guides et manuels.
Online Access:	Connect to the full text of this electronic book