On-wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond /

The increasing demand for more content, services, and security drives the development of high-speed wireless technologies, optical communication, automotive radar, imaging and sensing systems and many other mm-wave and THz applications. S-parameter measurement at mm-wave and sub-mm wave frequencies...

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Bibliographic Details

Main Author:	Rumiantsev, Andrej (Author)
Corporate Author:	Taylor & Francis
Format:	eBook
Language:	English
Published:	Gistrup, Denmark : River Publishers, [2019]
Series:	River Publishers series in electronic materials and devices.
Subjects:	Semiconductors > Characterization. Semiconductor wafers. Semiconductors > Calibration. Semi-conducteurs > Caractérisation. Plaquettes à gravure en semi-conducteurs. Semi-conducteurs > Étalonnage. SCIENCE / Energy TECHNOLOGY / Lasers Semiconductor wafers Semiconductors > Characterization Electronic books.
Online Access:	Connect to the full text of this electronic book