High-K gate dielectrics /

IntroductionThe need for high-k gate dielectrics and materials requirementDeposition techniquesALCVD, MOCVD, PLD, MBECharacterizationPhysico-chemical characterizationX-ray and electron spectroscopiesOxygen diffusion and thermal stabilityDefect characterization by ESRBand alignment determined by phot...

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Bibliographic Details
Corporate Author: Taylor & Francis
Other Authors: Houssa, Michel
Format: eBook
Language:English
Language Notes:English.
Published: Bristol ; Philadelphia : Institute of Physics, ©2004.
Series:Series in materials science and engineering.
Subjects:
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Call Number: TK7871.99.M44 H49 2004
 
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