Polymeric materials for electronics packaging and interconnection : developed from a symposium sponsored by the Divisions of Polymeric Materials: Science and Engineering and of Polymer Chemistry, Inc. at the 196th National Meeting of the American Chemical Society, Los Angeles, California, September 25-30, 1988 /

Bibliographic Details
Corporate Authors: American Chemical Society. Division of Polymeric Materials: Science and Engineering, American Chemical Society. Division of Polymer Chemistry, American Chemical Society. Meeting
Other Authors: Lupinski, John H., 1927-, Moore, Robert S., 1933-
Format: eBook
Language:English
Published: Washington, DC : American Chemical Society, 1989.
Series:ACS symposium series ; 407.
Subjects:
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • Polymeric materials for electronics packaging and interconnection : an overview / John H. Lupinski and Robert S. Moore
  • Cure studies of PMDA-ODA- and BTDA-ODA-based polyimides by fluorescence spectroscopy / Eric D. Wachsman, Peter S. Martin, and Curtis W. Frank
  • Dynamic Fourier transform-IR analysis of cure reactions and kinetics of polyimides / Randy W. Snyder and Paul C. Painter
  • Polyimide hydrolysis : measurement by Fourier transform-IR spectroscopy / Coralie A. Pryde
  • Dielectric characterization of water in polyimide and poly(amide-imide) thin films / Allyson J. Beuhler, Neal R. Nowicki, and Joanne M. Gaudette
  • Calculated final-state effects of the PMDA-ODA polyimide X-ray photoemission spectrum / A.R. Rossi and B.D. Silverman
  • Effect of diamic acid additives on dielectric constants of polyimides / Diane M. Stoakley and Anne K. St. Clair
  • Organic dielectric materials with reduced moisture absorption and improved electrical properties / D.L. Goff, E.L. Yuan, H. Long, and Herbert J. Neuhaus
  • Synthesis and characterization of the t-butyl ester of the oxydianiline-pyromellitic dianhydride polyamic acid / F.M. Houlihan, B.J. Bachman, C.W. Wilkins, Jr., and Coralie A. Pryde
  • Curing of binary mixtures of polyimides / C. Feger
  • Polyimides for dielectric layers / L.M. Baker, P.J. Brown, and J.L. Markham
  • Siloxane polyimides for interlayer dielectric applications / P.P. Policastro, John H. Lupinski, and P.K. Hernandez
  • Electrophoretic deposition of polyimides : electrocoating on the cathode / Stephen L. Buchwalter
  • Accelerated testing of polyimide coatings for neural prostheses / J. McHardy, D.I. Basiulis, G. Angsten, L.R. Higley, and R.N. Leyden
  • Conduction transients in polyimides / Herbert J. Neuhaus and Stephen D. Senturia
  • Polymer insulating layers for multilayer hybrid circuits / L.M. Baker, J.L. Markham, and R.D. Small
  • Fabrication and properties of thermoset films derived from bis-benzocyclobutene for multilayer applications / S.F. Hahn, P.H. Townsend, D.C. Burdeaux, and J.A. Gilpin
  • Synthesis of poly(arylene ether phenylquinoxaline) / James L. Hedrick and Jeff W. Labadie
  • High-performance silicone gel as integrated-circuit-device chip protection : cure study and electrical reliability / C.P. Wong
  • Silicone gels for semiconductor applications : chemistry and properties / Gust J. Kookootsedes
  • Advantages of silicone gel for packaging of devices with very large scale integration (VLSI) / Kanji Otsuka, Hisashi Ishida, Yasuyuki Utsumi, Takashi Miwa, and Yuji Shirai
  • Modeling of triple-track and comb-pattern leakage current measurements / Philip R. Troyk, David Conroy, and James E. Anderson
  • Silicone gels and coatings for integrated-circuit packaging / Justin C. Bolger
  • Ultraviolet-curable silicones for integrated-circuit protection / Michael A. Lutz and Kristen A. Scheibert
  • Moisture transport phenomena in epoxies for microelectronics applications / D.J. Belton, E.A. Sullivan, and M.J. Molter
  • Heterogeneous conduction processes in integrated-circuit encapsulation / D.A. Hoffmann, James E. Anderson, L.J. Bousse, and Curtis W. Frank
  • Novel coatings that maintain low surface-water concentrations / James E. Anderson, V. Markovac, I. Kim, and Philip R. Troyk
  • Thermal stress in epoxy molding compounds and packaged devices / W.F. van den Bogert, M.J. Molter, S.A. Gee, D.J. Belton, and V.R. Akylas
  • Characterization of stresses in polymer films for microelectronics applications / Rolf W. Biernath and David S. Soane
  • Stress factors in molding compounds / A.A. Gallo
  • New transfer molding compounds / E.W. Walles, John H. Lupinski, S. Bandes, and M. Rosenfield
  • Chemistry of stable brominated epoxies / C.S. Wang, D.B. Fritz, and A. Mendoza
  • Performance of stable brominated epoxies in encapsulants for microelectronic devices / D.B. Fritz and C.S. Wang
  • New polymeric materials for electronics packaging / H. Hacker, K.-R. Hauschildt, J. Huber, H. Laupenmühlen, and D. Wilhelm
  • Degradation of brominated epoxy resin and effects on integrated-circuit-device wirebonds / M. Nakao, T. Nishioka, M. Shimizu, H. Tabata, and K. Ito
  • Enhancement of gold-aluminum wirebond reliability in plastic encapsulated very large scale integration (VLSI) devices through C-Br bond stabilization / Muhib M. Khan, Homi Fatemi, Jeremias Romero, and Eugene Delenia
  • Ordered polymers for interconnection substrates / Richard Lusignea, Joseph Piche, and Richard Mathisen
  • Three-dimensional circuit interconnections with thermoplastic performance polymers / David C. Frisch and John F. Rowe
  • Significance of developments in new substrate materials / Edward Donnelly.