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Microelectronics processing : inorganic materials characterization : developed from a symposium sponsored by the Division of Industrial and Engineering Chemistry of the American Chemical Society /

Bibliographic Details
Corporate Author: American Chemical Society. Division of Industrial and Engineering Chemistry
Other Authors: Casper, L. A.
Format: eBook
Language:English
Language Notes:English.
Published: Washington, DC : American Chemical Society, 1986.
Series:ACS symposium series ; 295.
Subjects:
Microelectronics > Materials > Congresses.
Electronics.
Expert systems (Computer science)
Semiconductors.
Scanning electron microscopy.
Fourier transform infrared spectroscopy.
Raman spectroscopy.
Lasers.
Electronics
Expert Systems
Semiconductors
Microscopy, Electron, Scanning
Spectrometry, Mass, Secondary Ion
Photoelectron Spectroscopy
Optical Phenomena
Carbon > analysis
Oxygen > analysis
Silicon > analysis
Spectroscopy, Fourier Transform Infrared
Spectrum Analysis, Raman
Arsenicals > analysis
Gallium > analysis
Fourier Analysis
Trace Elements > analysis
Phosphorus Compounds > analysis
Oxides > analysis
Nickel > analysis
Chromium > analysis
Glass > analysis
Lasers
Microélectronique > Matériaux > Congrès.
Électronique.
Systèmes experts (Informatique)
Semi-conducteurs.
Microscopie électronique à balayage.
Spectroscopie infrarouge par transformée de Fourier.
Spectroscopie Raman.
semiconductor.
electronic engineering.
lasers (optical instruments)
TECHNOLOGY & ENGINEERING > Mechanical.
Scanning electron microscopy
Raman spectroscopy
Fourier transform infrared spectroscopy
Microelectronics > Materials
Electronic books.
Conference papers and proceedings
Online Access:Connect to the full text of this electronic book

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