Integrated circuits : chemical and physical processing : developed from the winter symposium sponsored by the Division of Industrial and Engineering Chemistry of the American Chemical Society, University of California--Davis, March 26-27, 1984 /
| Corporate Authors: | , |
|---|---|
| Other Authors: | |
| Format: | eBook |
| Language: | English |
| Language Notes: | English. |
| Published: |
Washington, D.C. :
American Chemical Society,
1985.
|
| Series: | ACS symposium series ;
290. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
Table of Contents:
- Unit processes in the manufacture of integrated circuits / Pieter Stroeve
- Conservation laws for mass, momentum, and energy : application to semiconductor devices and technology / Bill Baerg
- Silicon oxidation : a process step for the manufacture of integrated circuits / Eugene A. Irene
- Convective diffusion in zone refining of low Prandtl number liquid metals and semiconductors / William N. Gill, Nicholas D. Kazarinoff, and John D. Verhoeven
- Research opportunities in resist technology / David S. Soong
- Physical and chemical modifications of photoresists / Peter C. Sukanek
- Effects of developer concentration on linewidth control in positive photoresists / Tom Batchelder
- The advantage of molecular-beam epitaxy for device applications / A.Y. Cho
- Chemical and physical processing of ion-implanted integrated circuits / Joseph C. Plunkett
- Plasma-assisted processing : the etching of polysilicon in a diatomic chlorine discharge / Herbert H. Sawin, Albert D. Richards, and Brian E. Thompson
- Applications of oxides and nitrides of germanium for semiconductor devices / O.J. Gregory and E.E. Crisman
- Vapor-phase epitaxy of Group III-V compound optoelectronic devices / G.H. Olsen
- Advanced device isolation for very large scale integration / H.B. Pogge
- Solid-liquid equilibrium in ternary Group III-V semiconductor materials / T.L. Aselage, K.M. Chang, and T.J. Anderson : preparation of device-quality strained-layer superlattices / R.M. Biefeld
- Wafer design and characterization for integrated-circuit processes / R. Schindler, D. Huber, and J. Reffle.