APA (7th ed.) Citation

Bernstein, J. B., Bensoussan, A., & Bender, E. (2024). Reliability prediction for microelectronics. Wiley.

Chicago Style (17th ed.) Citation

Bernstein, Joseph B., Alain Bensoussan, and Emmanuel Bender. Reliability Prediction for Microelectronics. Hoboken, NJ: Wiley, 2024.

MLA (9th ed.) Citation

Bernstein, Joseph B., et al. Reliability Prediction for Microelectronics. Wiley, 2024.