Reliability prediction for microelectronics /

RELIABILITY PREDICTION FOR MICROELECTRONICS Wiley Series in Quality & Reliability Engineering REVOLUTIONIZE YOUR APPROACH TO RELIABILITY ASSESSMENT WITH THIS GROUNDBREAKING BOOK Reliability evaluation is a critical aspect of engineering, without which safe performance within desired parameters o...

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Bibliographic Details

Main Authors:	Bernstein, Joseph B. (Author), Bensoussan, Alain (Author), Bender, Emmanuel (Author)
Format:	eBook
Language:	English
Published:	Hoboken, NJ : Wiley, 2024.
Series:	Quality and Reliability Engineering Series
Subjects:	Microelectronics > Reliability.
Online Access:	Connect to the full text of this electronic book