Machine learning for high-risk applications : approaches to responsible AI /

The past decade has witnessed the broad adoption of artificial intelligence and machine learning (AI/ML) technologies. However, a lack of oversight in their widespread implementation has resulted in some incidents and harmful outcomes that could have been avoided with proper risk management. Before...

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Bibliographic Details
Main Authors: Hall, Patrick (Author), Curtis, James (Author), Pandey, Parul (Author)
Corporate Author: Safari, an O'Reilly Media Company
Other Authors: Sudjianto, Agus (writer of foreword.)
Format: eBook
Language:English
Published: Sebastopol, CA : O'Reilly Media, Inc., 2023.
Edition:[First edition].
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Call Number: Q325.5 .H35 2023
 
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Q325.5 .H35 2023 Available