Nanoscale characterization of surfaces and interfaces /

Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The techniques are described in...

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Bibliographic Details
Main Author: DiNardo, N. John
Format: eBook
Language:English
Published: Weinheim ; New York : VCH, ©1994.
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Online Access:Connect to the full text of this electronic book
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by DiNardo, N. John
Published 1994
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