Nanoscale characterization of surfaces and interfaces /
Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The techniques are described in...
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| Format: | eBook |
| Language: | English |
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Weinheim ; New York :
VCH,
©1994.
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| Online Access: | Connect to the full text of this electronic book |
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