Nanoscale characterization of surfaces and interfaces /

Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The techniques are described in...

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Bibliographic Details

Main Author:	DiNardo, N. John
Format:	eBook
Language:	English
Published:	Weinheim ; New York : VCH, ©1994.
Subjects:	Surfaces (Physics) Scanning tunneling microscopy. Nanotechnology. Electronic books.
Online Access:	Connect to the full text of this electronic book