X-ray characterization of materials /
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor fil...
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| Format: | eBook |
| Language: | English |
| Published: |
Weinheim ; New York :
Wiley-VCH,
©1999.
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| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Summary: | Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composit. |
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| Physical Description: | 1 online resource (xvi, 261 pages) : illustrations |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9783527613748 3527613749 9783527613755 3527613757 |