X-ray characterization of materials /

Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor fil...

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Bibliographic Details

Other Authors:	Lifshin, Eric
Format:	eBook
Language:	English
Published:	Weinheim ; New York : Wiley-VCH, ©1999.
Subjects:	Materials > Analysis. X-rays > Industrial applications. X-ray spectroscopy. Surfaces (Technology) > Analysis. Spectrometry, X-Ray Emission Electronic books.
Online Access:	Connect to the full text of this electronic book