Cover Image

Electrochemical nanotechnology : in-situ local probe techniques at electrochemical interfaces /

Show other versions (1)

A new window to local studies of interface phenomena at solid state surfaces has been opened by the development of local probe techniques such as Scanning Tunneling Microscopy (STM) or Atomic Force Microscopy (AFM) and related methods during the past fifteen years. The in-situ application of local p...

Full description

Bibliographic Details
Corporate Author: International Union of Pure and Applied Chemistry
Other Authors: Lorenz, W. J., Plieth, W. (Waldfried)
Format: eBook
Language:English
Published: Weinheim ; New York : Wiley-VCH, ©1998.
Subjects:
Nanotechnology.
Atomic force microscopy.
Electrochemistry.
Scanning probe microscopy.
Scanning tunneling microscopy.
Surface chemistry.
Surfaces (Physics)
Electrochemistry
Microscopy, Scanning Probe
Microscopy, Scanning Tunneling
Electronic books.
Online Access:Connect to the full text of this electronic book
Search Result 1
Cover Image
Published 1998
Book
Show all versions (2)