Electrochemical nanotechnology : in-situ local probe techniques at electrochemical interfaces /

A new window to local studies of interface phenomena at solid state surfaces has been opened by the development of local probe techniques such as Scanning Tunneling Microscopy (STM) or Atomic Force Microscopy (AFM) and related methods during the past fifteen years. The in-situ application of local p...

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Bibliographic Details

Corporate Author:	International Union of Pure and Applied Chemistry
Other Authors:	Lorenz, W. J., Plieth, W. (Waldfried)
Format:	eBook
Language:	English
Published:	Weinheim ; New York : Wiley-VCH, ©1998.
Subjects:	Nanotechnology. Atomic force microscopy. Electrochemistry. Scanning probe microscopy. Scanning tunneling microscopy. Surface chemistry. Surfaces (Physics) Electrochemistry Microscopy, Scanning Probe Microscopy, Scanning Tunneling Electronic books.
Online Access:	Connect to the full text of this electronic book