Electrochemical nanotechnology : in-situ local probe techniques at electrochemical interfaces /

A new window to local studies of interface phenomena at solid state surfaces has been opened by the development of local probe techniques such as Scanning Tunneling Microscopy (STM) or Atomic Force Microscopy (AFM) and related methods during the past fifteen years. The in-situ application of local p...

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Bibliographic Details
Corporate Author:	International Union of Pure and Applied Chemistry
Other Authors:	Lorenz, W. J., Plieth, W. (Waldfried)
Format:	eBook
Language:	English
Published:	Weinheim ; New York : Wiley-VCH, ©1998.
Subjects:	Nanotechnology. Atomic force microscopy. Electrochemistry. Scanning probe microscopy. Scanning tunneling microscopy. Surface chemistry. Surfaces (Physics) Electrochemistry Microscopy, Scanning Probe Microscopy, Scanning Tunneling Electronic books.
Online Access:	Connect to the full text of this electronic book

Description
Summary:	A new window to local studies of interface phenomena at solid state surfaces has been opened by the development of local probe techniques such as Scanning Tunneling Microscopy (STM) or Atomic Force Microscopy (AFM) and related methods during the past fifteen years. The in-situ application of local probe methods in different systems belongs to modern nanotechnology and has two aspects: an analytical aspect and a preparative aspect. The first aspect covers the application of the local probe methods to characterize thermodynamic, structural and dynamic properties of solid state surfaces and inter.
Item Description:	"A publication initiated by IUPAC."
Physical Description:	1 online resource (xi, 324 pages) : illustrations
Format:	Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Bibliography:	Includes bibliographical references and index.
ISBN:	9783527612154 3527612157 9783527612147 3527612149