Nanometer-scale defect detection using polarized light /

This book describes experimental and theoretical methods that are implemented within the framework of fundamental research to better understand physical and chemical processes at the nanoscale that are responsible for the remarkable properties of materials used in innovative technological devices. I...

Full description

Bibliographic Details
Main Author: Dahoo, Pierre Richard (Author)
Format: eBook
Language:English
Published: London, UK : Hoboken, NJ : ISTE ; Wiley, 2016.
Series:Mechanical engineering and solid mechanics series.
Subjects:
Online Access:Connect to the full text of this electronic book
Search Result 1
by Dahoo, Pierre Richard
Published 2016
Book