Nanometer-scale defect detection using polarized light /

This book describes experimental and theoretical methods that are implemented within the framework of fundamental research to better understand physical and chemical processes at the nanoscale that are responsible for the remarkable properties of materials used in innovative technological devices. I...

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Bibliographic Details
Main Author: Dahoo, Pierre Richard (Author)
Format: eBook
Language:English
Published: London, UK : Hoboken, NJ : ISTE ; Wiley, 2016.
Series:Mechanical engineering and solid mechanics series.
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Call Number: TA409 .D34 2016
 
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TA409 .D34 2016 Available