Nanometer-scale defect detection using polarized light /

This book describes experimental and theoretical methods that are implemented within the framework of fundamental research to better understand physical and chemical processes at the nanoscale that are responsible for the remarkable properties of materials used in innovative technological devices. I...

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Bibliographic Details
Main Author: Dahoo, Pierre Richard (Author)
Format: eBook
Language:English
Published: London, UK : Hoboken, NJ : ISTE ; Wiley, 2016.
Series:Mechanical engineering and solid mechanics series.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:This book describes experimental and theoretical methods that are implemented within the framework of fundamental research to better understand physical and chemical processes at the nanoscale that are responsible for the remarkable properties of materials used in innovative technological devices. It presents optical techniques based on polarized light allowing the characterization of defects in materials or in their interfaces that are likely to impact performance. It also describes ways of knowing mechanical properties of nanomaterials by using theoretical models and analysis of experimental results and their uncertainties.
Physical Description:1 online resource (xiv, 296 pages .)
Bibliography:Includes bibliographical references and index.
ISBN:9781119329633
1119329639
9781119329657
1119329655