Next generation HALT and HASS : robust design of electronics and systems /

Next Generation HALT and HASS presents a major paradigm shift from reliability prediction-based methods to discovery of electronic systems reliability risks. This is achieved by integrating highly accelerated life test (HALT) and highly accelerated stress screen (HASS) into a physics-of-failure-base...

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Bibliographic Details

Main Authors:	Gray, Kirk (Author), Paschkewitz, John James (Author)
Format:	eBook
Language:	English
Published:	Chichester, UK ; Hoboken, NJ : John Wiley & Sons, 2016.
Subjects:	Accelerated life testing. Electronic systems > Design and construction. Electronic systems > Testing. Electronic books.
Online Access:	Connect to the full text of this electronic book