Runs and scans with applications /

Expert practical and theoretical coverage of runs and scansThis volume presents both theoretical and applied aspects of runs and scans, and illustrates their important role in reliability analysis through various applications from science and engineering. Runs and Scans with Applications presents ne...

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Bibliographic Details
Main Author: Balakrishnan, N., 1956-
Other Authors: Koutras, Markos V.
Format: eBook
Language:English
Language Notes:English.
Published: New York : J. Wiley, ©2002.
Series:Wiley series in probability and statistics.
Subjects:
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Call Number: QA273 .B25475 2002eb
 
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QA273 .B25475 2002eb Available