Digital logic testing and simulation /

The increase in the size and complexity of circuits on a chip with little or no increase in the number of Input/Output pins has made the need for testing ever more important. The test must detect failures in individual units, as well as failures caused by defective manufacturing processes. Random de...

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Bibliographic Details

Main Author:	Miczo, Alexander
Format:	eBook
Language:	English
Published:	Hoboken, NJ : Wiley-Interscience, ©2003.
Edition:	2nd ed.
Subjects:	Digital electronics > Testing.
Online Access:	Connect to the full text of this electronic book