Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presen...

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Bibliographic Details
Main Authors: Servín, Manuel (Author), Quiroga, J. Antonio (Juan Antonio) (Author), Padilla, J. Moisés (José Moisés) (Author)
Format: eBook
Language:English
Published: Weinheim : Wiley-VCH, [2014]
Edition:First edition.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such.
Item Description:Edition statement from running title area.
Physical Description:1 online resource (xvi, 328 pages) : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:1306840880
9781306840880
9783527681082
3527681086
3527411526
9783527411528
9783527681105
3527681108