Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presen...

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Bibliographic Details

Main Authors:	Servín, Manuel (Author), Quiroga, J. Antonio (Juan Antonio) (Author), Padilla, J. Moisés (José Moisés) (Author)
Format:	eBook
Language:	English
Published:	Weinheim : Wiley-VCH, [2014]
Edition:	First edition.
Subjects:	Interferometry. Diffraction patterns. Optical measurements. Interferometry
Online Access:	Connect to the full text of this electronic book