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Microelectronics failure analysis : desk reference /

Bibliographic Details
Corporate Authors: Knovel (Firm), Electronic Device Failure Analysis Society (Contributor)
Other Authors: Gandhi, Tejinder (Editor)
Format: eBook
Language:English
Published: Materials Park, Ohio : ASM International, [2019]
Edition:Seventh edition.
Subjects:
Electronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Materials > Testing > Handbooks, manuals, etc.
Microelectronics > Materials > Defects > Handbooks, manuals, etc.
Electronic apparatus and appliances > Testing > Handbooks, manuals, etc.
Semiconductors > Defects > Handbooks, manuals, etc.
Microélectronique > Défauts > Guides, manuels, etc.
Appareils électroniques > Essais > Guides, manuels, etc.
Semi-conducteurs > Défauts > Guides, manuels, etc.
Electronic apparatus and appliances > Testing.
Electronics > Materials > Testing.
Microelectronics > Materials > Defects.
Microelectronics > Materials > Testing.
Semiconductors > Defects.
Electronic books.
Handbooks and manuals.
Online Access:Connect to the full text of this electronic book
Description
Item Description:"An ASM materials solutions publication."
"EDFAS, Electronic Device Failure Analysis Society, ASM International."
Physical Description:1 online resource (xi, 705 pages) : illustrations (some color)
Bibliography:Includes bibliographical references and indexes.
ISBN:9781627082471
1627082476
9781627082464
1627082468
9781523126323
1523126329