Microelectronics failure analysis : desk reference /

Bibliographic Details
Corporate Authors:	Knovel (Firm), Electronic Device Failure Analysis Society (Contributor)
Other Authors:	Gandhi, Tejinder (Editor)
Format:	eBook
Language:	English
Published:	Materials Park, Ohio : ASM International, [2019]
Edition:	Seventh edition.
Subjects:	Electronics > Materials > Testing > Handbooks, manuals, etc. Microelectronics > Materials > Testing > Handbooks, manuals, etc. Microelectronics > Materials > Defects > Handbooks, manuals, etc. Electronic apparatus and appliances > Testing > Handbooks, manuals, etc. Semiconductors > Defects > Handbooks, manuals, etc. Microélectronique > Défauts > Guides, manuels, etc. Appareils électroniques > Essais > Guides, manuels, etc. Semi-conducteurs > Défauts > Guides, manuels, etc. Electronic apparatus and appliances > Testing. Electronics > Materials > Testing. Microelectronics > Materials > Defects. Microelectronics > Materials > Testing. Semiconductors > Defects. Electronic books. Handbooks and manuals.
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