Logic testing and design for testability /

Bibliographic Details
Main Author:	Fujiwara, Hideo
Format:	eBook
Language:	English
Published:	Cambridge, Mass. : MIT Press, ©1985.
Series:	MIT Press series in computer systems
Subjects:	Logic circuits > Testing. COMPUTER SCIENCE/General Electronic books.
Online Access:	Connect to the full text of this electronic book

Available Online