Introduction to spectroscopic ellipsometry of thin film materials : instrumentation, data analysis and applications /

Bibliographic Details
Main Authors:	Yin, Xinmao (Author), Wee, Andrew T. S. (Author), Tang, Chi Sin (Author)
Corporate Author:	EBSCOhost
Format:	eBook
Language:	English
Published:	Weinheim : Wiley-VCH, [2022]
Subjects:	Thin films > Spectra. Ellipsometry. Spectrum analysis. Couches minces > Spectre. Ellipsométrie. Electronic books.
Online Access:	Connect to the full text of this electronic book

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