APA (7th ed.) Citation

Ho, P. S., Hu, C., Gall, M., & Sukharev, V. (2022). Electromigration in metals: Fundamentals to nano-interconnects. Cambridge University Press. https://doi.org/10.1017/9781139505819

Chicago Style (17th ed.) Citation

Ho, P. S., Chao-Kun Hu, Martin Gall, and Valeriy Sukharev. Electromigration in Metals: Fundamentals to Nano-interconnects. Cambridge, United Kingdom ; New York, NY: Cambridge University Press, 2022. https://doi.org/10.1017/9781139505819.

MLA (9th ed.) Citation

Ho, P. S., et al. Electromigration in Metals: Fundamentals to Nano-interconnects. Cambridge University Press, 2022. https://doi.org/10.1017/9781139505819.