Microwave photoelasticity : exploiting multiple resonances to measure stress changes within yttria-partially-stabilized /

Bibliographic Details
Main Authors: Waldstein, Seth W. (Author), Schemmel, Peter J. (Author)
Format: Government Document eBook
Language:English
Published: Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, October 2021.
Series:NASA technical memorandum ; 20210018297.
Subjects:
Online Access:https://purl.fdlp.gov/GPO/gpo171817