Examining the submicron world /

X-ray microscope

Bibliographic Details

Corporate Author:	NATO Advanced Study Institute on Improved Methods for Examining the Submicron World Nova Scotia
Other Authors:	Feder, Ralph, McGowan, J. William (James William), 1931-, Shinozaki, Douglas M.
Format:	Conference Proceeding Book
Language:	English
Published:	New York : Plenum Press, [1986]
Series:	NATO ASI series. Physics ; v. 137.
Subjects:	Microscopy, Electron > Congresses. Electron Probe Microanalysis > Congresses.