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Total ionizing dose test report for the SFT2222A NPN bipolar junction transistor /

Bibliographic Details
Main Authors: Chen, Dakai, 1982- (Author), Forney, James (Author)
Format: Government Document eBook
Language:English
Published: Greenbelt, Maryland : National Aeronautics and Space Administration, Goddard Space Flight Center, April 2021.
Series:NASA technical memorandum ; 20210010530.
Subjects:
Bipolar transistors.
Junction transistors.
Online Access:https://purl.fdlp.gov/GPO/gpo157757
Description
Item Description:"April 2021."
Physical Description:1 online resource (approximately 22 pages) : illustrations.
Bibliography:Includes bibliographical references (page 5).