Total ionizing dose test report for the SFT2222A NPN bipolar junction transistor /

Bibliographic Details

Main Authors:	Chen, Dakai, 1982- (Author), Forney, James (Author)
Format:	Government Document eBook
Language:	English
Published:	Greenbelt, Maryland : National Aeronautics and Space Administration, Goddard Space Flight Center, April 2021.
Series:	NASA technical memorandum ; 20210010530.
Subjects:	Bipolar transistors. Junction transistors.
Online Access:	https://purl.fdlp.gov/GPO/gpo157757