Long-Term Reliability of Nanometer VLSI Systems : Modeling, Analysis and Optimization /

This book provides readers with a detailed reference regarding two of the most important long-term reliability and aging effects on nanometer integrated systems, electromigrations (EM) for interconnect and biased temperature instability (BTI) for CMOS devices. The authors discuss in detail recent de...

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Bibliographic Details

Main Authors:	Tan, Sheldon (Author), Tahoori, Mehdi (Author), Kim, Taeyoung (Author), Wang, Shengcheng (Author), Sun, Zeyu (Author), Kiamehr, Saman (Author)
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	Cham : Springer International Publishing : Imprint: Springer, 2019.
Edition:	1st ed. 2019.
Subjects:	Electronic circuits. Microprocessors. Electronic Circuits and Devices. Circuits and Systems. Processor Architectures. Electronic books.
Online Access:	Connect to the full text of this electronic book