Noise in Nanoscale Semiconductor Devices /

This book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defect...

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Bibliographic Details

Corporate Author:	SpringerLink (Online service)
Other Authors:	Grasser, Tibor (Editor)
Format:	eBook
Language:	English
Published:	Cham : Springer International Publishing : Imprint: Springer, 2020.
Edition:	1st ed. 2020.
Subjects:	Electronic circuits. Electronics. Microelectronics. Circuits and Systems. Electronic Circuits and Devices. Electronics and Microelectronics, Instrumentation. Electronic books.
Online Access:	Connect to the full text of this electronic book