Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits /
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality is...
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| Format: | eBook |
| Language: | English |
| Published: |
CRC Press,
2017.
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| Edition: | 1st edition. |
| Subjects: | |
| Online Access: | Connect to this electronic resource |