Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits /

Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality is...

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Bibliographic Details

Main Authors:	Goel, Sandeep (Author), Chakrabarty, Krishnendu (Author)
Corporate Author:	Safari, an O'Reilly Media Company
Format:	eBook
Language:	English
Published:	CRC Press, 2017.
Edition:	1st edition.
Subjects:	Electronic books.
Online Access:	Connect to this electronic resource