APA (7th ed.) Citation

Goel, S., & Chakrabarty, K. (2017). Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits (1st edition.). CRC Press.

Chicago Style (17th ed.) Citation

Goel, Sandeep, and Krishnendu Chakrabarty. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits. 1st edition. CRC Press, 2017.

MLA (9th ed.) Citation

Goel, Sandeep, and Krishnendu Chakrabarty. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits. 1st edition. CRC Press, 2017.

Warning: These citations may not always be 100% accurate.