Reliability and Failure of Electronic Materials and Devices, 2nd Edition /
Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on st...
| Main Authors: | Ohring, Milton (Author), Kasprzak, Lucian (Author) |
|---|---|
| Corporate Author: | Safari, an O'Reilly Media Company |
| Format: | eBook |
| Language: | English |
| Published: |
Academic Press,
2014.
|
| Edition: | 2nd edition. |
| Subjects: | |
| Online Access: | Connect to this electronic resource |
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