Reliability and Failure of Electronic Materials and Devices, 2nd Edition /

Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus on st...

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Bibliographic Details

Main Authors:	Ohring, Milton (Author), Kasprzak, Lucian (Author)
Corporate Author:	Safari, an O'Reilly Media Company
Format:	eBook
Language:	English
Published:	Academic Press, 2014.
Edition:	2nd edition.
Subjects:	Electronic books.
Online Access:	Connect to this electronic resource