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Characterization of Wide Bandgap Power Semiconductor Devices /

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The book has 11 chapters and covers the following topics: Pulsed static characterization; Junction capacitance characterization; Fundamentals of dynamic characterization; Gate drive for dynamic characterization; Layout design and parasitic management; Protection design for double pulse test; Measure...

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Bibliographic Details
Main Author: Wang, Fei (Fred)
Corporate Author: Institution of Engineering and Technology
Other Authors: Jones, Edward A., Zhang, Zheyu
Format: eBook
Language:English
Published: Stevenage : IET, 2018.
Series:Energy Engineering.
Subjects:
Electric capacity.
Electronic apparatus and appliances.
Power semiconductors.
Semiconductors.
Wide gap semiconductors.
capacitance.
network topology.
power semiconductor devices.
semiconductor device models.
wide band gap semiconductors.
cross-talk
data processing
double pulse test protection design
dynamic characterization measurement
gate drive
junction capacitance characterization
layout design
parasitic management
pulsed static characterization
three-phase system
topology
wide bandgap power semiconductor devices
Online Access:Connect to the full text of this electronic book
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