Metrology and diagnostic techniques for nanoelectronics /

Bibliographic Details

Corporate Author:	Taylor & Francis
Other Authors:	Ma, Zhiyong, 1950- (Editor), Seiler, David G. (Editor)
Format:	eBook
Language:	English
Published:	Singapore : Pan Stanford Publishing, [2017]
Subjects:	Nanoelectronics. Metrology. Electronic books.
Online Access:	Connect to the full text of this electronic book